SCANNING FORCE MICROSCOPY (SFM)
| Technique | Type of apparatus |
Partner name, Contact person Expertise of the personel |
Types of possible experiments |
| Scanning Force Microscopy | Multimode 8, NanoScope-D3100, NanoScope V-D3100, Dimension ICON / MFP-3D |
IPF
Dipl.-Phys. Andreas Janke Tel.: +49(0)3514658-496
surface characterization by AFM (since 1992) and SEM
|
- Surface morphology / roughness - Phase imaging / material contrast, electrical charge distribution, magnetic contrast - Mechanical Properties: E-modulus, adhesion, energy dissipation |
| SFM force measurements | NanoScope IIIa-D3100, NanoScope V-D3100, Dimension ICON, Multimode 8 |
IPF
Dr. rer. nat. Astrid Drechsler Tel.: +49(0)3514658-540
Polymer surfaces: morphology, roughness, interaction forces, contact angle, wetting and absorption, adsorption
|
- Investigation of surface morphology, roughness, material contrast - Force measurements in air and fluids at variable temperature - Colloidal probe technique |
| Atomic Force Microscopy |
Solver PRO, NT-MDT |
TUL Dr Izabela Bobowska Tel.: +48 426313205 |
- Surface morphology / roughness - Phase imaging / material contrast, electrical charge distribution, magnetic contrast |
| Atomic Force Microscope |
AFM System, NanoSurf Easy Scan, Swiss STM, Easy Scan, Nanosurf, SwisS |
INSTM Prof. J.M. Kenny |
- Carbon nanotubes alone or in nanocomposite, organic and inorganic polymers (metalized), stem cells on polymers, antique ceramics, epoxy resins, proteins - Topography of surfaces |
Scanning Force Microscopy
|
NANOSCOPE Multimode Digital Instruments (VEECO) |
TECNALIA José Luis Viviente, researcher |
- Biomaterials and biomedical fields - Bionanotechnology and nanomaterials - Microandnanometricdimensionalmeasurements - Electric potential and force measurements |
| Stylus Profiler |
DektakXT-E, Bruker |
TUL Dr Ireneusz Glowacki Tel.: +48 426313205 |
- Surface morphology / roughness - Contact measurement |
